ESIM: A Multimodel Design Error and Fault Simulator for Logic Circuits

نویسندگان

  • Hussain Al-Asaad
  • John P. Hayes
چکیده

ESIM is a simulation tool that integrates logic fault and design error simulation for logic circuits. It targets several design error and fault models, and uses a novel mix of simulation algorithms based on parallel-pattern evaluation, multiple error activation, single fault propagation, and critical path tracing. Several experiments are discussed to demonstrate the power of ESIM.

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تاریخ انتشار 2000